ARLINGTON, Va.–(BUSINESS WIRE)–JEDEC Solid State Technology Association, the global leader in standards development for the microelectronics industry, announces the publication of JEP183: Guidelines for Measuring the Threshold Voltage (VT) of SiC MOSFETs. The first publication developed by JEDEC’s JC-70.2 silicon carbide subcommittee, JEP183 is available for free download from the JEDEC website.