SiC MOSFET power modules are becoming global solutions in systems operating in harsh environment, and due to large economic implications, achieving reliability of such systems is of utmost importance. Thereby, this paper is focused on improving the reliability of the...
The drain to gate capacitance (Miller capacitance) of SiC MOSFETs leads to the Miller effect during switching transients. The Miller capacitance in a phase-leg configuration causes the crosstalk, the interaction between the two complementary switches, and the Miller...
This work presents a comprehensive study on the behaviour and operation of a vertical 1.2 kV 4H-SiC junctionless power FinFET. The increased bulk conduction in the channel of this topology may bring reductions in the channel resistance compared to trench MOSFETs,...
With increasing applications of silicon carbide (SiC) power MOSFETs, more attention is being paid to reliability issues, among which the long-term stability of the gate threshold voltage is of paramount importance. In this study, laboratory experiments are conducted...
We investigate the accuracy and reliability of temperature mapping using scanning thermal microscopy (SThM) in contact and PeakForce tapping mode on the example of a GaN-on-SiC high electron mobility transistor (HEMT). HEMT steady-state and transient surface...
